机译:通过Fe_3Si / p-Si结构中的界面态从低掺杂p-Si中提取自旋相关的电空穴
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia|Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk 660041, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia|Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk 660041, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia|Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk 660041, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia|Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk 660041, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia;
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia;
spin accumulation; interface states; hybrid structures; Hanle effect; iron silicide;
机译:利用导纳光谱法分析Al / p-Si和Al / Bi4Ti3O12 / p-Si结构的温度相关界面态,串联电阻和交流电导率
机译:界面陷阱,串联电阻和(Ni掺杂的PVA)中间层对Al / p-Si(MS)结构中电特性的作用
机译:使用霍尔测量分析对p-Si / SiGe / Si-Ti结构处的Ti-Si(100)界面进行低温电学表征
机译:γ射线辐照对直接键合的p-Si / p-Si结的电学性质的影响
机译:使用脉冲电检测磁共振研究(111)取向的磷掺杂晶体硅与二氧化硅界面处的自旋相关跃迁和自旋相干性。
机译:NH4OH处理可最佳地权衡水热Ga掺杂n-ZnO / p-Si异质结构特征
机译:在FE3SI / P-Si结构中通过界面状态从低掺杂P-Si从旋转依赖的电气孔提取