Analyses of temperature-dependent interface states, series resistances,and AC electrical conductivities of Al/p-Si and Al/Bi4Ti3O12/p-Si structures by using the admittance spectroscopy method

著录项

• 来源
  《中国物理：英文版》 |2013年第10期|608-613|共6页
• 作者

  Mert Yildirim; Perihan Durmus; Semsettin Altindal;

  展开▼
• 作者单位

  Department of Physics, Faculty of Arts & Sciences, Düzce University, 81620, Düzce, Turkey;

  Department of Physics, Faculty of Sciences, Gazi University, 06500, Ankara, Turkey;

  Department of Physics, Faculty of Sciences, Gazi University, 06500, Ankara, Turkey;

  展开▼
• 收录信息 中国科学引文数据库(CSCD);中国科技论文与引文数据库(CSTPCD);
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词