Getting a Handle on Variability

摘要

"The inability to scale the tolerance of multiple electrical parameters along with their nominal value has contributed to a virtual crisis in the ability to improve performance and power consumption in new processes," according to Sani Nassif and colleagues at IBM's Research Center (Austin, Texas) and the company's T.J. Watson Center (Yorktown Heights, N.Y.). In fact, CMOS variability is beginning to become a major design limiter that must be managed judiciously.