X-RAY PROPERTIES OF CADMIUM TELLURIDE AND ZINC TELLURIDE THIN FILMS

摘要

Thin film of highly pure (99.999%) CdTe/ZnTe prepared by high vacuum technique (HVT 5 × 10~(-6) torr), on glass substrates have thickness 0.3 nm at different substrate temperatures. The X-ray diffraction study of the film represents amorphous nature at lower deposition temperature but poly-crystalline at higher deposition temperature. The film deposited at lower temperatures were annealed for one hour in vacuum of 5 × 10~(-3) torr at as-deposited to 600K.