Investigation of the Optical and Electrical Properties of Copper Telluride and Cadmium Telluride Thin Films Using Electrodeposition Technique

摘要

Copper and Cadmium Telluride thin films have been successfully deposited on a glass substrate indium doped Tin oxide (ITO) by electrodeposition technique. The absorbance was measured using M501 UV-visible spectrophotometer in the wavelength range of 300-900 nm. Copper and Cadmium Telluride thin films were investigated at room temperature. The absorbance of cadmium telluride thin films of sample CdTe2 and CdT3 increase with the wavelength while sample CdTe1, CdT4 and CdT5 partially increase as the wavelength increases. The transmittance spectra of the cadmium telluride thin films deposited increases with the wavelength. The absorbance of copper telluride thin films were found to be in the range of 0.152-0.334 for sample CT1, 0.064-0.254 for sample CT2, 0.065-0.257 for sample CT3, 0.049-0.272 for sample CT4 and 0.009-0.220 for sample CT5. Absorbance of copper telluride films is high in the UV region and in visible and IR regions. The transmission spectrum has a very high transmittance in the VIS-NIR regions of the electromagnetic spectrum. It is also observed that the transmittance of the films is high in visible & infrared regions. The band gap energy of (2.0eV-2.2eV for CT) and (2.2eV-2.5 for CdT) was obtained.