USING AFM TOPOGRAPHY MEASUREMENTS IN NANOPARTICLE SIZING

摘要

Two simple recipes for preparing Fe_3O_4 nanoparticles are briefly presented. The nanoparticles were characterized using Dynamic Light Scattering and Atomic Force Microscopy. The results of the DLS procedure are presented in detail and discussed in connection with the AFM results, highlighting the differences between the size distribution in connection with the preparation parameters.