New cavity perturbation technique for microwave measurement of dielectric constant

摘要

A new cavity perturbation technique is presented for microwave measurement of dielectric constant, which uses a modified cylindrical reentrant cavity. Though suitable for only low dielectric constants, the method has the advantages, (a) sample area does not appear in the calculations, (b) only the ratio of frequency shifts due to two samples of same area and different thickness is involved, and (c) calibration of the measuring system with known dielectric is not necessary.