首页> 外文期刊>Review of Scientific Instruments >Conceptual design of new polychromator on Thomson scattering system to measure Zeff
【24h】

Conceptual design of new polychromator on Thomson scattering system to measure Zeff

机译:在Thomson散射系统上测量Zeff的新型多色仪的概念设计

获取原文
获取原文并翻译 | 示例
       

摘要

To measure the Zeff with electron temperature (Te) and electron density (ne) profiles at the same time and the same position in the KSTAR tokamak, we design a new polychromator for Thomson scattering system that has additional function. The additional function is measuring bremsstrahlung intensity to calculate Zeff independent of Thomson signals. For this new polychromator, we design and fabricate a collimation lens set, and interference filter that has center wavelength of 523 nm and 2 nm FWHM. Finally, we change the lenses, detector diodes, and add the bremsstrahlung filter on the KSTAR edge Thomson scattering polychromator. Then this new polychromator was tested by Tungsten light and monochromator.
机译:为了同时在KSTAR托卡马克中的相同位置和电子位置测量具有电子温度(Te)和电子密度(ne)分布的Zeff,我们为Thomson散射系统设计了一种具有附加功能的新型多色仪。附加功能是测量致辐射强度,以独立于Thomson信号计算Zeff。对于这种新的多色仪,我们设计并制造了准直透镜组和干涉滤光片,其中心波长为523 nm,FWHM为2 nm。最后,我们更换镜头,检测器二极管,并在KSTAR边缘Thomson散射多色仪上添加ms致辐射滤光片。然后,该新的多色仪通过钨丝灯和单色仪进行测试。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号