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Dual frequency open-loop electric potential microscopy for local potential measurements in electrolyte solution with high ionic strength

机译:双频开环电势显微镜用于高离子强度电解质溶液中的局部电势测量

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Recent development of open-loop electric potential microscopy (OL-EPM) has enabled to measure local potential distribution at a solid/liquid interface. However, the operating environment of OL-EPM has been limited to a weak electrolyte solution (<1 mM). This has significantly limited its application range in biology and chemistry. To overcome this limitation, we have developed dual frequency (DF) mode OL-EPM. In the method, an ac bias voltage consisting of two frequency components at f1 and f2 is applied between a tip and sample. The local potential is calculated from the amplitudes of the f1 and |f1 - f2| components of the electrostatic force. In contrast to the conventional single frequency (SF) mode OL-EPM, the detection of the 2f1 component is not required in DF mode. Thus, the maximum bias modulation frequency in DF mode is twice as high as that in SF mode. The high bias modulation frequency used in DF mode prevents the generation of electrochemical reactions and redistribution of ions and water, which enables to operate OL-EPM even in a strong electrolyte solution. In this study, we have performed potential measurements of nanoparticles on a graphite surface in 1 and 10 mM NaCl solution. The results demonstrate that DF mode OL-EPM allows measurements of local potential distribution in 10 mM electrolyte solution.
机译:开环电势显微镜(OL-EPM)的最新发展使得能够测量固/液界面处的局部电势分布。但是,OL-EPM的操作环境仅限于弱电解质溶液(<1 mM)。这极大地限制了其在生物学和化学领域的应用范围。为克服此限制,我们开发了双频(DF)模式OL-EPM。在该方法中,将在f1和f2处由两个频率分量组成的交流偏置电压施加到尖端和样品之间。根据f1和| f1-f2 |的幅度计算局部电势静电力的分量。与传统的单频(SF)模式OL-EPM相比,在DF模式下不需要检测2f1分量。因此,DF模式下的最大偏置调制频率是SF模式下的两倍。 DF模式下使用的高偏置调制频率可防止电化学反应的产生以及离子和水的重新分布,从而即使在强电解质溶液中也可以运行OL-EPM。在这项研究中,我们已经在1和10 mM NaCl溶液中进行了石墨表面纳米颗粒的电势测量。结果表明,DF模式OL-EPM可以测量10 mM电解质溶液中的局部电势分布。

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