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VACANCY SPECTROSCOPY OF RADIATION CROSS-LINKED AND DEGRADED POLYTETRAFLUOROETHYLENES

机译:辐射交联降解聚四氟乙烯的空位光谱

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Polytetrafluoroethylene samples having different morphology were prepared by radiation induced cross-linking and degradation, and positron annihilation lifetimes were measured to extract information about the vacancy structure from the ortho-positronium (o-Ps) component. The o-Ps intensity I_3 was inversely correlated with the crystallinity confirming that this component is associated with the amorphous part. The o-Ps lifetime τ_3, was distinctly different depending on the phase of the polymer. Below the γ relaxation temperature, the vacancies produced by degradation could be seen from an increase in the τ_3 value, but at temperatures between the γ and β relaxations such vacancies became invisible due to the activated segment motion. And above the β relaxation temperature vacancies in the interface between crystalline and amorphous parts appear to affect τ_3. The o-Ps intensity did not show stable reproducible results. Accumulation of positive charge can be responsible for it. The results, not only unveiling the not yet well understood behavior of the o-Ps component, demonstrate the uniqueness of the vacancy spectroscopy using o-Ps as a probe.
机译:通过辐射诱导的交联和降解制备具有不同形态的聚四氟乙烯样品,并测量正电子an灭寿命,以从邻正电子(o-Ps)组分中提取有关空位结构的信息。 o-Ps强度I_3与结晶度成反比,从而确认该组分与非晶部分有关。 o-Ps寿命τ_3明显不同,取决于聚合物的相。在γ弛豫温度以下,可以从τ_3值的增加中看出降解产生的空位,但是在γ和β弛豫之间的温度下,由于激活的链段运动,这种空位变得不可见。在β弛豫温度之上,结晶和非晶部分之间的界面中的空位似乎会影响τ_3。 o-Ps强度未显示稳定的可再现结果。正电荷的积累可能是造成这种情况的原因。结果不仅揭示了尚未完全理解的o-Ps组分的行为,还证明了使用o-Ps作为探针的空位光谱法的独特性。

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