STUDY OF THE INFLUENCE OF THERMAL EFFECTS ON THE ELECTROMIGRATION TESTS

摘要

A simple one-dimensional thermal model of the electromigration phenomenon shows that the usual measurement methods of the temperature during lifetime tests usually lead to an erroneous determination of Black's relation parameters n and Q. The effects of the current density and the temperature estimation method on the errors on n and Q are analysed. An estimation of the temperature of the site where the flux divergence is maximum allows us to understand the behaviour of n and Q. The difference between real and apparent activation energy, at low current densities, is also calculated.