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Detection of a periodic structure embedded in surface roughness, for various correlation functions

机译:检测表面粗糙度中嵌入的周期性结构,以实现各种相关函数

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摘要

This paper deals with surface profilometry, where we try to detect a periodic structure, hidden in randomness using the matched filter method of analysing the intensity of light, scattered from the surface. From the direct problem of light scattering from a composite rough surface of the above type, we find that the detectability of the periodic structure can be hindered by the randomness, being dependent on the correlation function of the random part. In our earlier works, we had concentrated mainly on the Cauchy-type correlation function for the rough part. In the present work, we show that this technique can determine the periodic structure of different kinds of correlation functions of the roughness, including Cauchy, Gaussian etc. We study the detection by the matched filter method as the nature of the correlation function is varied.
机译:本文涉及表面轮廓测量法,我们尝试使用匹配滤波器方法分析从表面散射的光强度,以检测随机隐藏的周期性结构。从上述类型的复合粗糙表面散射光的直接问题,我们发现,周期性结构的可检测性可能会受到随机性的影响,这取决于随机部分的相关函数。在我们早期的工作中,我们主要集中在粗糙部分的柯西型相关函数上。在目前的工作中,我们表明该技术可以确定粗糙度的各种相关函数的周期性结构,包括柯西,高斯等。随着相关函数性质的变化,我们研究了使用匹配滤波器方法进行检测。

著录项

  • 来源
    《Pramana》 |2011年第4期|p.611-626|共16页
  • 作者

    V C VANI; S CHATTERJEE;

  • 作者单位

    Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore, 560 012, India;

    Indian Institute of Astrophysics, Bangalore, 560 034, India;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Matched filter; rough surface; detection; 42.25.Fx; 42.30.Kq; 42.30.Sy;

    机译:匹配的滤波器;粗糙的表面;检测;42.25.Fx;42.30.Kq;42.30.Sy;

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