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首页> 外文期刊>Polymer Engineering and Science >Optical Properties of PMMA Doped With Erbium(III) and Ytterbium(III) Complexes
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Optical Properties of PMMA Doped With Erbium(III) and Ytterbium(III) Complexes

机译:掺Er(III)和Y(III)配合物的PMMA的光学性质

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摘要

In this article, we report the fabrication and optical/spectroscopic properties of polymethylmethacrylate (PMMA) doped with rare earth (RE) (Er^sup 3+^ and Er^sup 3+^/Yb^sup 3+^) ions. Infrared spectroscopy revealed only very weak O-H stretching vibration peaks in the samples, which is important if satisfactory photoluminescence is to be observed at 1530 nm. Measurement of transmission spectra in the wavelength ranges from 300 to 700 nm for Er^sup 3+^-doped samples and from 900 to 1050 nm for Yb^sup 3+^-doped samples enabled us to observe the ^sup 4^G^sub 11/2^ (377 nm) and ^sup 2^H^sub 11/2^ (519 nm) transmission bands typical for Er^sup 3+^-doped samples, as well as the ^sup 2^F^sub 5/2^ (975 nm) band typical for Yb^sup 3+^-doped samples. Under excitation at 980 nm, at room temperature, the characteristic Er^sup 3+^ emission at 1530 nm was also observed with improving trend when the higher RE concentrations were applied. The results indicate that the PMMA reveals very low tendency to the RE clustering, which together with low cost and easy fabrication make it a material with a great potential in the active photonics devices. [PUBLICATION ABSTRACT]
机译:在本文中,我们报告了掺杂有稀土(RE)(Er ^ sup 3 + ^和Er ^ sup 3 + ^ / Yb ^ sup 3 + ^)离子的聚甲基丙烯酸甲酯(PMMA)的制备和光学/光谱性质。红外光谱显示样品中只有非常弱的O-H拉伸振动峰,如果要在1530 nm处观察到令人满意的光致发光,这一点很重要。对掺Er 3+的样品在300至700 nm波长范围内的透射光谱的测量以及掺Y 3+的掺样品在900至1050 nm波长范围内的透射光谱的测量使我们能够观察s 4 ^ G ^。 sub 11/2 ^(377 nm)和sup 2 ^ H ^ sub 11/2 ^(519 nm)传输带,典型的是Er ^ sup 3 + ^掺杂的样品,以及^ sup 2 ^ F ^ sub掺Y 3 + ^样品的典型5/2 ^(975 nm)波段。在室温下在980 nm激发下,在1530 nm处还观察到特征Er 3 + 3发射,并且当施加更高的RE浓度时具有改善的趋势。结果表明,PMMA显示出极低的RE聚集趋势,其成本低廉且易于制造,使其成为有源光子器件中具有巨大潜力的材料。 [出版物摘要]

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    《Polymer Engineering and Science》 |2009年第9期|p.1814-1817|共4页
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    Vaclav Prajzler,1 Ivan Huttel,2 Oleksiy Lyutakov,2 Jiri Oswald,3 Vladimir Machovic,2 Vitezslav Jerabek11 Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University,16627 Prague 6, Czech Republic2 Institute of Chemical Technology, 16628 Prague 6, Czech Republic3 Institute of Physics, Academy of Sciences of the Czech Republic, 16253 Prague 6, Czech RepublicCorrespondence to: Vaclav Prajzler, e-mail: xprajzlv@feld.cvut.czContract grant sponsor: GA CR Grant (Czech Technical University, Prague), contract grant number: 102/09/P104, contract grant sponsor: MSM, contract grant number: 6840770014.DOI 10.1002/pen.21418Published online in Wiley InterScience (www.interscience.wiley.com).© 2009 Society of Plastics Engineers,;

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