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Nonintrusive electron number density measurements in the plume of a 1 kW arcjet using a modern microwave interferometer

机译:使用现代微波干涉仪测量1 kW电弧喷射器羽流中的非侵入式电子数密度

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Reported is the use of a microwave interferometric technique for making nonintrusive measurements of plasma electron number density in the plume of a space electric propulsion thruster. The technique is capable of providing good sensitivity and accuracy as well as resolution using modern microwave network analyzer technology. Density profiles were obtained throughout the plume of a 1 kW hydrogen arcjet based on accurate microwave differential phase measurements. Spatially resolved integrated phase shifts for a 17.5 GHz signal radiated through the plume at various radial positions were Abel inverted to calculate radial electron density profiles. All measurements were taken in the University of Michigan's Large Chamber Plasma Facility, a 6 m by 9 m vacuum chamber, at pressures of 2/spl middot/10/sup -4/ Torr or less. The interferometer measured electron densities as low as 1/spl middot/10/sup 15/ m/sup -3/ with a predicted capability to measure peak densities as high as 3/spl middot/10/sup 18/ m/sup -3/. The accuracy of this technique is estimated to be on the order of /spl plusmn/10%. Comparison with Langmuir probe electron number density measurements demonstrate relative agreement between the two methods. Further, a previously reported tendency for the Langmuir probe to underpredict electron number density was consistent with our measurements. It is postulated that this underprediction may be due to small Langmuir probe perturbations in the local plasma of the far-field plume and errors in estimation of the probe collection area.
机译:据报道,使用微波干涉技术对空间电动推进器羽流中的等离子体电子数密度进行非侵入式测量。使用现代的微波网络分析仪技术,该技术能够提供良好的灵敏度和准确性以及分辨率。基于精确的微波微分相位测量,获得了整个1 kW氢弧射流羽流的密度分布图。通过在不同径向位置通过羽流辐射的17.5 GHz信号的空间分辨积分相移进行Abel倒置,以计算径向电子密度分布。所有测量均在密歇根大学大室等离子体设备中进行,该室为6 m x 9 m的真空室,压力为2 / spl middot / 10 / sup -4 / Torr或更低。干涉仪测得的电子密度低至1 / spl middot / 10 / sup 15 / m / sup -3 /,并且具有预测的测量峰值密度的能力,电子密度高达3 / spl middot / 10 / sup 18 / m / sup -3 /。估计此技术的准确性约为/ spl plusmn / 10%。与Langmuir探针电子数密度测量值的比较证明了两种方法之间的相对一致性。此外,先前报道的Langmuir探针低估电子数密度的趋势与我们的测量结果一致。据推测,这种低估可能是由于在远场羽流的局部等离子体中较小的Langmuir探针扰动和探针收集面积的估计误差所致。

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