首页> 外文会议>30th AIAA/ASME/SAE/ASEE Joint Propulsion Conference June 27-29, 1994/Indianapolis, IN >Non-Intrusive Electron Number Density Measurements in the Plume of a 1 KW Arcjet Using a Modern Microwave Interferometer
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Non-Intrusive Electron Number Density Measurements in the Plume of a 1 KW Arcjet Using a Modern Microwave Interferometer

机译:使用现代微波干涉仪在1 KW Arcjet羽流中进行非侵入式电子数密度测量

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Reported here is the use of a microwave interferometric technique for making non-intrusive measurements of electron number density. Electron number density profiles were obtained throughout the plume of a 1 kW hydrogen arcjet by using a modern microwave network analyzer to obtain highly accurate differential phase measurements. Spatially resolved integrated phase shifts for a 17.5 GHz signal radiated through the plume at various radial positions were Abel inverted to calculate radial electron density profiles. For these tests, a probe positioning system was used to radially sweep the antenna assembly across the plume at various axial positions. All measurements were taken in the University of Michigan's Large Chamber Plasma Facility, a 6 m by 9 m vacuum chamber, at pressures of 2 x 10~-4 Torr or less. The interferometer was shown to measure electron densities as low as 1x10~15 m~-3 and is predicted to be capable of measuring peak densities as high as 3x10~18 m~-3. The accuracy of this technique is estimated to be on the order of +-10 percent. Comparison with Langmuir probe electron number density measurements demonstrate general agreement to within the accuracy of the two measurement techniques. However, a tendency for the Langmuir probe to under predict electron number density was observed for all experiments. It is postulated that this under prediction may be due to small Langmuir probe perturbations in the local plasma of the far-field plume, an observation shared by others.
机译:这里报道了使用微波干涉技术进行电子数密度的非侵入式测量。通过使用现代微波网络分析仪获得高度准确的差分相位测量值,可在整个1 kW氢弧射流的整个羽流中获得电子数密度分布。通过羽状辐射在不同径向位置辐射的17.5 GHz信号的空间分辨积分相移,通过Abel倒置来计算径向电子密度分布。对于这些测试,使用探针定位系统在不同的轴向位置将天线组件径向扫过羽流。所有测量均在密歇根大学大室等离子体设备中进行,该设备为6 m x 9 m的真空室,压力为2 x 10〜-4 Torr或更小。干涉仪显示可以测量低至1x10〜15 m〜-3的电子密度,并且预计能够测量高达3x10〜18 m〜-3的峰值密度。估计该技术的准确性约为+ -10%。与Langmuir探针电子数密度测量结果的比较表明,在两种测量技术的精度范围内总体上是一致的。但是,在所有实验中都观察到Langmuir探针的电子数密度不足的趋势。据推测,这种预测不足的原因可能是由于在远场羽流的局部等离子体中存在小的Langmuir探针扰动,这是其他人所共有的一种观察结果。

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