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首页> 外文期刊>IEEE Transactions on Plasma Science >Time evolution of hollow cathode ionization processes in the final breakdown phase of a transient hollow cathode discharge
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Time evolution of hollow cathode ionization processes in the final breakdown phase of a transient hollow cathode discharge

机译:在瞬态空心阴极放电的最终击穿阶段中空心阴极电离过程的时间演化

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摘要

The enhanced ionization processes taking place inside the hollow cathode region (HCR) of a transient hollow cathode discharge (THCD) are essential events which lead to final electrical breakdown. This ionization growth is permanently assisted by a virtual anode moving in the anode-cathode gap (A-K gap), which extends the anode potential to within the hollow cathode region. In the paper, the ionization growth inside the HCR under the enhanced field due to the close proximity of the anode potential has been studied using a statistical technique in a range of pressures, with three different cathode apertures. Statistical time distributions of an extensive experimental data set are analyzed to understand the mechanisms involved in the final stages, just before electric breakdown.
机译:瞬态空心阴极放电(THCD)的空心阴极区域(HCR)内部发生的增强电离过程是导致最终电击穿的重要事件。通过在阳极-阴极间隙(A-K间隙)中移动的虚拟阳极永久性地辅助该电离生长,这将阳极电位扩展到空心阴极区域内。在本文中,已经使用统计技术在一定压力范围内使用三个不同的阴极孔,研究了由于阳极电位的紧密接近而在增强电场下HCR内部的电离生长。分析大量实验数据集的统计时间分布,以了解在电击穿之前最终阶段所涉及的机制。

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