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Propagation Model of High-Power Electromagnetic Pulse by Using a Serial–Parallel Resistors Circuit

机译:串联-并联电阻电路的大功率电磁脉冲传播模型

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The risk of high power electromagnetic (HPEM) pulse is dramatically increasing as the output of HPEM pulse increases and the affected electronic devices becomes smaller , . There are largely two ways of coupling HPEM pulse: 1) front door coupling, which is through antennas and sensors to receive signals and 2) back-door coupling, which is through an unintended way, such as punctures and slots. In this paper, we modeled the loss phenomenon of HPEM pulse which happens when HPEM pulse radiated from HPEM system propagates to the receiving antenna. The loss circuit consists of serial–parallel resistors, each value of resistor is formularized as distance. Our modeling consists of two parts: 1) one-stage model, which means initial value for various applications and 2) th-stage model, which means additional distances. Therefore, we could figure out the effect of HPEM on antenna as the propagation distance changes. After the due simulations, we confirm our hypothesis as the HPEM pulse which reaches to receiving antenna is consistent with the existing theory. This circuit modeling is very remarkable in that it understands two different HPEM system and propagation/receiving antenna as one whole system.
机译:随着HPEM脉冲的输出增加以及受影响的电子设备变小,高功率电磁(HPEM)脉冲的风险急剧增加。耦合HPEM脉冲的方式主要有两种:1)前门耦合,这是通过天线和传感器来接收信号的; 2)后门耦合,这是通过意外的方式,例如穿刺和缝隙。在本文中,我们对HPEM脉冲的损耗现象进行了建模,该损耗现象是从HPEM系统辐射的HPEM脉冲传播到接收天线时发生的。损耗电路由串联-并联电阻组成,每个电阻的值表示为距离。我们的建模包括两个部分:1)一阶段模型,这意味着各种应用的初始值; 2)th阶段模型,这意味着更多的距离。因此,随着传播距离的变化,我们可以找出HPEM对天线的影响。经过适当的仿真后,我们证实了我们的假设,即到达接收天线的HPEM脉冲与现有理论一致。该电路建模非常出色,因为它将两个不同的HPEM系统和传播/接收天线理解为一个整体系统。

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