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首页> 外文期刊>Physical Review. B, Condensed Matter >Low-energy electron diffraction from ferroelectric surfaces: Dead layers and surface dipoles in clean Pb(Zr,Ti)O_3(001)
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Low-energy electron diffraction from ferroelectric surfaces: Dead layers and surface dipoles in clean Pb(Zr,Ti)O_3(001)

机译:来自铁电表面的低能量电子衍射:清洁PB(Zr,Ti)O_3(001)中的死层和表面偶极子

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摘要

The positions of the low energy electron diffraction (LEED) spots from ferroelectric single crystal films depend on its polarization state, due to electric fields generated outside of the sample. Onemay derive the surface potential energy, yielding the depth where the mobile charge carriers compensating the depolarization field are located (δ). On ferroelectric Pb(Zr,Ti)O_3(001) samples, surface potential energies are between 6.7 and 10.6 eV, and δ values are unusually low, in the range of 1.8 ± 0.4A. When δ is introduced in the values of the band bending inside the ferroelectric, a considerably lower value of the dielectric constant and/or of the polarization near the surface than their bulk values is obtained, evidencing either that the intrinsic ‘dielectric constant’ of the material has this lower value or the existence of a ‘dead layer’ at the free surface of clean ferroelectric films. The inwards polarization of these films is explained in the framework of the present considerations by the formation of an electron sheet on the surface. Possible explanations are suggested for discrepancies between the values found for surface potential energies from LEED experiments and those derived from the transition between mirror electron microscopy and low energy electron microscopy.
机译:来自铁电单晶膜的低能量电子衍射(LEED)斑点的位置取决于其偏振状态,由于样品外部的电场。 OneMay导出表面电位能量,产生补偿去极化场的移动电荷载体所在的深度(δ)。在铁电PB(Zr,Ti)O_3(001)样品上,表面电位能量在6.7和10.6eV之间,Δ值异常低,范围为1.8±0.4a。当在铁电弯曲内部的带弯曲的值中引入δ时,获得的介电常数和/或表面附近的偏振值比其散装值相当较低的值,证明了所属的“介电常数”材料具有这种较低的值或在清洁铁电膜的自由表面处存在“死层”。通过在表面上形成电子板,在本发明考虑的框架中解释了这些膜的向内极化。建议可能的解释对于来自LEED实验的表面电位能量的值与来自镜子电子显微镜和低能量电子显微镜之间的过渡的值之间的差异。

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  • 来源
    《Physical Review. B, Condensed Matter》 |2017年第12期|115438.1-115438.15|共15页
  • 作者单位

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania;

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania;

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania;

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania;

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania;

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania;

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania;

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania and University of Bucharest Faculty of Physics Atomis¸tilor 405 077125 Magurele-Ilfov Romania;

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania and University of Bucharest Faculty of Physics Atomis¸tilor 405 077125 Magurele-Ilfov Romania;

    National Institute of Materials Physics Atomis¸tilor 405A 077125 Magurele-Ilfov Romania and University of Bucharest Faculty of Physics Atomis¸tilor 405 077125 Magurele-Ilfov Romania;

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