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Aging behavior in single-domain Mn-doped BaTiO_3 crystals: Implication for a unified microscopic explanation of ferroelectric aging

机译:Mn掺杂的BaTiO_3单畴晶体的时效行为:对铁电时效的统一微观解释的含义

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摘要

The change of ferroelectric, dielectric, and piezoelectric properties with time, the ferroelectric aging phenomena, has been observed in most ferroelectrics. Phenomenologically, aging can be attributed to the gradual stabilization of ferroelectric domains by defects, but the microscopic origin of the domain stabilization has remained controversial. It is unclear whether the domain stabilization is a boundary effect (caused by domain-wall-pinning) or a volume effect (stabilization of the whole domain). In the present paper, we made a single-domain (domain-wall-free) Mn-doped BaTiO_3 single crystal and studied the aging behavior of its hysteresis loop. We found that after aging, the single-domain sample shows a significant increase in the coercive field, clearly indicating a strong stabilization of the single domain. Furthermore, the sample exhibits an abnormal double hysteresis loop, which corresponds to an interesting reversible domain switching process. These are direct evidence for the stabilization of single domain by aging. Our results preclude any explanation by the domain-wall-pinning effect and strongly suggest that the volume effect is the governing mechanism for the aging in hysteresis loop. We further show that the microscopic origin of the volume effect comes naturally from a general symmetry-conforming property of point defects. Such a microscopic mechanism can explain not only the aging in hysteresis loop (large signal aging) but also the aging in dielectric and piezoelectric constants (small signal aging), thus providing a unified microscopic explanation for all kinds of ferroelectric aging.
机译:在大多数铁电体中都观察到铁电,介电和压电特性随时间的变化,即铁电老化现象。从现象学上讲,老化可归因于缺陷使铁电畴逐渐稳定,但畴稳定的微观起源仍存在争议。尚不清楚域稳定是边界效应(由域壁钉扎引起)还是体积效应(整个域的稳定)。在本文中,我们制备了单畴(无畴壁)Mn掺杂BaTiO_3单晶,并研究了其磁滞回线的老化行为。我们发现,老化后,单域样品在矫顽场中显示出显着增加,清楚地表明了单域的强稳定性。此外,样品表现出异常的双滞后回线,这与有趣的可逆域切换过程相对应。这些是通过老化稳定单个域的直接证据。我们的结果排除了畴壁钉扎效应的任何解释,并强烈暗示,体积效应是磁滞回线中老化的主导机制。我们进一步表明,体积效应的微观根源自然来自点缺陷的一般对称性。这种微观机制不仅可以解释磁滞回线的老化(大信号老化),而且可以解释介电常数和压电常数的老化(小信号老化),从而为各种铁电老化提供了统一的微观解释。

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