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Aging Effect In Paraelectric State Of Ferroelectrics: Implication For A Microscopic Explanation Of Ferroelectric Deaging

机译:铁电体顺电状态下的老化效应:对铁电老化的微观解释的含义

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Most ferroelectric materials exhibit aging effect (a time-dependent change in physical properties) in their ferroelectric state; however, aging is not reported to exist in the paraelectric state. In this letter we report the existence of a "paraelectric aging effect" in Mn-doped (Ba_(0.80)Sr_(0.20))TiO_3 ceramics. We found that when the paraelectric state is formed from an aged ferroelectric state through a reverse ferroelectric transition, the paraelectric state shows a gradual increase in the dielectric permittivity and decrease in dielectric loss with time. Such paraelectric aging effect exists only in acceptor-doped samples, not in undoped samples. The kinetics of the paraelectric aging follows a simple relaxation function with activation energy of 0.43 eV. Our results suggest that the paraelectric aging stems from the migration of oxygen vacancies, being the same as the case of ferroelectric aging. We show that such a migration is driven by a symmetry-conforming short-range ordering tendency of point defects. Such a microscopic mechanism also provides a microscopic explanation for the well-observed "ferroelectric deaging effect."
机译:大多数铁电材料在其铁电状态下均表现出老化效应(随时间变化的物理性质)。但是,据报道在顺电状态下不存在老化。在这封信中,我们报告了锰掺杂的(Ba_(0.80)Sr_(0.20))TiO_3陶瓷中存在“顺电时效效应”。我们发现,当通过逆铁电跃迁由老化的铁电状态形成顺电状态时,顺电状态显示介电常数随着时间逐渐增加而介电损耗减小。这种顺电时效效应仅存在于掺杂受体的样品中,而不存在于未掺杂的样品中。顺电老化的动力学遵循简单的松弛函数,其活化能为0.43 eV。我们的结果表明,顺电时效与铁电时效相同,是由于氧空位的迁移引起的。我们表明,这种迁移是由点缺陷的对称符合短程排序趋势驱动的。这种微观机制还为人们充分观察到的“铁电衰老效应”提供了微观解释。

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