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Semiconductor-metal transition in semiconducting bilayer sheets of transition-metal dichalcogenides

机译:过渡金属二卤化物半导体双层板中的半导体-金属过渡

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Using first-principles calculations we show that the band gap of bilayer sheets of semiconducting transition-metal dichalcogenides (TMDs) can be reduced smoothly by applying vertical compressive pressure. These materials undergo a universal reversible semiconductor-to-metal (S-M) transition at a critical pressure. The S-M transition is attributed to lifting of the degeneracy of the bands at the Fermi level caused by interlayer interactions via charge transfer from the metal to the chalcogen. The S-M transition can be reproduced even after incorporating the band gap corrections using hybrid functionals and the GW method. The ability to tune the band gap of TMDs in a controlled fashion over a wide range of energy opens up the possibility for its usage in a range of applications.
机译:使用第一性原理计算,我们表明,可以通过施加垂直压缩压力来平稳地减小半导体过渡金属二硫化碳(TMDs)双层板的带隙。这些材料在临界压力下经历了通用的可逆半导体到金属(S-M)转变。 S-M跃迁归因于费米能级的能级退化,这是由于层间相互作用通过电荷从金属转移到硫族元素引起的层间相互作用而引起的。即使在使用混合功能和GW方法合并了带隙校正之后,也可以重现S-M转换。在广泛的能量范围内以受控方式调谐TMD的带隙的能力为在各种应用中使用它提供了可能性。

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