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Atomic structure and microstructures of supertetragonal multiferroic BiFeO_3 thin films

机译:超四方多铁性BiFeO_3薄膜的原子结构和显微结构

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摘要

We revisit the atomic structure and microstructure of the so-called supertetragonal phases of highly strained epitaxial BiFeO_3 thin films. Quantitative atomic resolution scanning transmission electron microscopy is used to directly image the atomic positions. A crystallographic phase suggested by electron diffraction and predicted by ab initio calculations is evidenced. Microtwins are reported in thickest films. Electron energy loss spectroscopy is further employed to reveal subtle electronic structure features, which, interpreted in a framework of antiferrodistortive distortions coupling with the substrate, point towards a phase closer to the P4mm purely tetragonal phase.
机译:我们重新审视了高应变外延BiFeO_3薄膜的所谓超四方相的原子结构和微观结构。定量原子分辨率扫描透射电子显微镜用于直接成像原子位置。证明了由电子衍射提示并由头算计算预测的结晶相。据报道,在最厚的薄膜中有微孪晶。电子能量损失光谱进一步用于揭示微妙的电子结构特征,在与基底耦合的反铁畸变畸变的框架中解释,该电子结构特征指向更接近P4mm纯四方相的相。

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  • 来源
    《Physical review》 |2014年第10期|104106.1-104106.9|共9页
  • 作者单位

    Institut Pprime, UPR3346 CNRS-Universite de Poitiers, Material Physics and Mechanics Department, Bd M. & P. Curie, 86962 Futuroscope-Chasseneuil, France,Canadian Center for Electron Microscopy, Brockhouse Institute for Materials Research, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S4M1, Canada;

    Canadian Center for Electron Microscopy, Brockhouse Institute for Materials Research, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S4M1, Canada,National Research Council Canada, 1200 Montreal Road, Ottawa, ON, K1A 0R6, Canada;

    Unite Mixte de Physique CNRS/Thales, Campus de l'Ecole Polytechnique, 1 Avenue Fresnel, 91767 Palaiseau, France and Universite Paris-Sud, 91405, Orsay, France;

    Unite Mixte de Physique CNRS/Thales, Campus de l'Ecole Polytechnique, 1 Avenue Fresnel, 91767 Palaiseau, France and Universite Paris-Sud, 91405, Orsay, France;

    Institut Pprime, UPR3346 CNRS-Universite de Poitiers, Material Physics and Mechanics Department, Bd M. & P. Curie, 86962 Futuroscope-Chasseneuil, France;

    Unite Mixte de Physique CNRS/Thales, Campus de l'Ecole Polytechnique, 1 Avenue Fresnel, 91767 Palaiseau, France and Universite Paris-Sud, 91405, Orsay, France;

    Unite Mixte de Physique CNRS/Thales, Campus de l'Ecole Polytechnique, 1 Avenue Fresnel, 91767 Palaiseau, France and Universite Paris-Sud, 91405, Orsay, France;

    Unite Mixte de Physique CNRS/Thales, Campus de l'Ecole Polytechnique, 1 Avenue Fresnel, 91767 Palaiseau, France and Universite Paris-Sud, 91405, Orsay, France;

    Unite Mixte de Physique CNRS/Thales, Campus de l'Ecole Polytechnique, 1 Avenue Fresnel, 91767 Palaiseau, France and Universite Paris-Sud, 91405, Orsay, France;

    Unite Mixte de Physique CNRS/Thales, Campus de l'Ecole Polytechnique, 1 Avenue Fresnel, 91767 Palaiseau, France and Universite Paris-Sud, 91405, Orsay, France;

    Canadian Center for Electron Microscopy, Brockhouse Institute for Materials Research, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S4M1, Canada;

    Institut Pprime, UPR3346 CNRS-Universite de Poitiers, Material Physics and Mechanics Department, Bd M. & P. Curie, 86962 Futuroscope-Chasseneuil, France;

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  • 正文语种 eng
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  • 关键词

    composition and phase identification;

    机译:组成和相识别;

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