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Magnetic and nonmagnetic doping dependence of the conducting surface states in SmB_6

机译:SmB_6中导电表面态的磁性和非磁性掺杂依赖性

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摘要

Kondo insulator SmB_6 has attracted attention because it can realize new topological phenomena driven by the interplay between strong correlation effect and topology. However, its topological nature is still under debate. To examine the topological aspect, we demonstrate the nonmagnetic La and magnetic Ce doping dependence of the resistance of SmB_6. Moreover, the resistance ratios of different thicknesses are analyzed to confirm the surface contribution. Lightly doped La samples show a purely conducting surface region at low temperature, whereas the lightly doped Ce samples do not have any conducting region at low temperature. Furthermore, based on the analysis of the electrical transport data of Sm_(1-x)La_xB_6 (0.0 ≤ x ≤ 1.0), an electronic phase diagram was found, composed of four regions: region Ⅰ (0.0 ≤ x ≤ 0.06), Ⅱ (0.1 ≤ x ≤ 0.15), Ⅲ (x ≈ 0.2), and Ⅳ (0.25 ≤ x ≤ 1.0). Region Ⅰ is characterized by the presence of conducting surface states, region Ⅱ is characterized by the insulating phase due to the d-f hybridization gap without the conducting surface state, region Ⅲ is characterized by the disappearance of the d-f hybridization gap and the existence of valence fluctuation, and region IV is a typical metallic state.
机译:近藤绝缘子SmB_6可以实现强相关效应和拓扑之间的相互作用,从而实现新的拓扑现象,因此引起了人们的关注。但是,其拓扑性质仍在争论中。为了检查拓扑方面,我们证明了SmB_6电阻的非磁性La和磁性Ce掺杂依赖性。此外,分析不同厚度的电阻比以确认表面贡献。轻掺杂的La样品在低温下显示出纯导电表面区域,而轻掺杂的Ce样品在低温下没有任何导电区域。此外,根据Sm_(1-x)La_xB_6(0.0≤x≤1.0)的电传输数据分析,发现了一个电子相图,该电子相图由四个区域组成:区域Ⅰ(0.0≤x≤0.06),Ⅱ (0.1≤x≤0.15),Ⅲ(x≈0.2)和Ⅳ(0.25≤x≤1.0)。区域Ⅰ的特征在于存在导电表面状态,区域Ⅱ的特征在于由于df杂交间隙而没有导电表面状态的绝缘相,区域Ⅲ的特征在于df杂交间隙的消失和化合价的存在,区域IV是典型的金属状态。

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  • 来源
    《Physical Review. B, Condensed Matter》 |2016年第16期|165102.1-165102.6|共6页
  • 作者单位

    School of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 61005, Korea;

    Universitaet Wuerzbure, Experimentelle Physilc Ⅶ, 97074 Wuerzbure, Germany;

    School of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 61005, Korea;

    School of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 61005, Korea;

    School of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 61005, Korea;

    School of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 61005, Korea;

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