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机译:通过光谱法探测外延石墨烯中界面缓冲层的介电响应
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA;
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA;
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA;
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA,Joint Quantum Institute, University of Maryland, College Park, Maryland 20742, USA;
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA;
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA;
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA;
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA;
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA;
机译:光谱法探测外延石墨烯中界面缓冲层的介电响应
机译:光谱法探测外延石墨烯中界面缓冲层的介电响应
机译:中红外吸收和拉曼光谱探测外延石墨烯和缓冲层的氢嵌入
机译:使用Terahertz光谱研究的GaAs缓冲层中的GaAs缓冲层中的相干纵向光学声音的动态特性
机译:通过中红外,磁光,偏振敏感光谱法探测单层和异质石墨烯多层中的回旋共振特征和AC量子霍尔效应。
机译:通过光谱法探测外延石墨烯中界面缓冲层的介电响应
机译:使用Terahertz光谱研究的GaAs缓冲层中的GaAs缓冲层中的相干纵向光学声音的动态特性