首页> 外文期刊>Physica status solidi >The parameters that play role in numerical parameter variation in two-center holographic recording in photorefractive lithium niobate (LiNbO_3) and strontium barium niobate (Sr_xBa(1-x)Nb_2O_6)
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The parameters that play role in numerical parameter variation in two-center holographic recording in photorefractive lithium niobate (LiNbO_3) and strontium barium niobate (Sr_xBa(1-x)Nb_2O_6)

机译:在光折变铌酸锂(LiNbO_3)和铌酸锶钡(Sr_xBa(1-x)Nb_2O_6)的两中心全息记录中在数值参数变化中起作用的参数

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摘要

We have conducted a numerical study of (he dependence of nonvolatile data storage on the holographic parameter variation for a two-center holographic recording (TCHR) process. Parameters of the photorefractive crystals and the experimental conditions such as the electron mobility in the conduction band, the level concen-trations, the electron-recombination coefficients, the bulk photovoltaic coefficient, the spatial period of modulation, the dielectric constant, and the modulation depth are studied numerically. The results of the numerical calculations showed that the significant parameters are the electron mobility in the conduction band, the electron-recombination coefficient, and the concentrations of the dopant levels (levels created due to the dopants) in the TCHR process. It seems that the electron-recombination coefficient for deep levels plays a more important role than the other parameters.
机译:我们已经进行了一项数值研究(对于两中心全息记录(TCHR)过程,非易失性数据存储对全息参数变化的依赖性。光折射晶体的参数和实验条件,例如导带中的电子迁移率,数值研究了能级浓度,电子复合系数,体光电系数,调制空间周期,介电常数和调制深度,数值计算结果表明,重要参数是电子迁移率在导带中,电子复合系数和TCHR过程中掺杂物能级的浓度(由于掺杂物产生的能级)似乎表明,深能级的电子复合系数比其他能级更重要参数。

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