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High-speed photoresponse properties of ultraviolet (UV) photodiodes using vertically aligned Al:ZnO nanowires

机译:使用垂直排列的Al:ZnO纳米线的紫外(UV)光电二极管的高速光响应特性

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摘要

Ultraviolet (UV) photodiodes with fast photoresponse properties were fabricated using vertically aligned aluminum doped ZnO nanowires. Stable p-type ZnO have been achieved by doping equimolar concentration of P-N (0.75 at.%) simultaneously in ZnO. The vertically aligned and electrically conducting n-type Al (3 at.%) doped ZnO nanowires were grown by a simple aqueous chemical growth process. The structural, morphological, optical, and electrical properties were investigated. For the fabrication of UV photodiodes, the optimum p-type ZnO layers and n-type ZnO nanowires were stacked upon ITO substrate. A 250 nm thin NiO was deposited as an electron blocking layer (EBL) in between the ZnO p-n junctions. The current density-voltage (J-V) characteristic of the fabricated UV photodiode was measured under dark and UV illumination conditions. Under a reverse bias of 3 V, the device exhibits a high photoresponsivity (R) value of 15.07 (A/W) upon illumination of UV light (λ = 365 nm). The fabricated photodiode exhibits a fast photoresponse switching characteristics with a response and recovery time calculated as 61 ± 11 and 455 ± 41 ms, respectively. The role of vertically aligned nanowires in the formation of oxygen interstitial (O_i) defects and its impact on improving the UV photoresponse properties were investigated.
机译:使用垂直排列的铝掺杂ZnO纳米线制造了具有快速光响应特性的紫外线(UV)光电二极管。通过在ZnO中同时掺杂等摩尔浓度的P-N(0.75 at。%),可以实现稳定的p型ZnO。通过简单的水性化学生长工艺生长了垂直排列且导电的n型Al(3原子%)掺杂的ZnO纳米线。研究了结构,形态,光学和电学性质。为了制造紫外光电二极管,将最佳的p型ZnO层和n型ZnO纳米线堆叠在ITO衬底上。在ZnO p-n结之间沉积250 nm的薄NiO作为电子阻挡层(EBL)。在黑暗和紫外线照射条件下,测量制造的紫外线光电二极管的电流密度-电压(J-V)特性。在3 V的反向偏置下,该器件在紫外光(λ= 365 nm)照射下表现出15.07(A / W)的高光响应(R)值。制成的光电二极管具有快速的光响应开关特性,响应时间和恢复时间分别计算为61±11 ms和455±41 ms。研究了垂直排列的纳米线在氧间隙(O_i)缺陷形成中的作用及其对改善UV光响应性能的影响。

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  • 来源
    《Physica status solidi》 |2017年第9期|1600658.1-1600658.13|共13页
  • 作者单位

    Optoelectronic Materials and Devices Lab, Department of Physics, National Institute of Technology, Tiruchirappalli, Tamil Nadu, India;

    Optoelectronic Materials and Devices Lab, Department of Physics, National Institute of Technology, Tiruchirappalli, Tamil Nadu, India;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    defects; nanowires; photodiodes; quantum efficiency; ultraviolet; ZnO;

    机译:缺陷纳米线;光电二极管量子效率紫外线氧化锌;

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