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Growth of Ge_(1-x)Sn_x Nanowires by Chemical Vapor Deposition via Vapor–Liquid–Solid Mechanism Using GeH_4 and SnCl_4

机译:通过使用GeH_4和SnCl_4的汽-液-固机理通过化学气相沉积法生长Ge_(1-x)Sn_x纳米线

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In this work we report on the elaboration and characterization of Ge_(1-x)Sn_xrnnanowires synthetized by chemical vapor deposition (CVD) via vapor–liquid–rnsolid (VLS) mechanism using GeH_4 and SnCl_4 as precursors. We haverninvestigated tin incorporation in Ge as a function of experimental growthrnconditions such as growth temperature and Sn precursor partial pressurern(P_(SnCl4)/P_(GeH4) ratio). We have demonstrated Ge_(1-x)Sn_x nanowires with Snrnincorporation around 1 at.% in the core with a thin Sn-rich shell with up torn10 at.% Sn well beyond the equilibrium solubility of Sn in bulk Ge.
机译:在这项工作中,我们报告了以GeH_4和SnCl_4为前驱体,通过化学汽相淀积(CVD)通过汽液固(VLS)机理合成的Ge_(1-x)Sn_xrnnanowires的细化和表征。我们已经根据实验生长条件(例如生长温度和Sn前驱体分压(P_(SnCl4)/ P_(GeH4)比率)来研究Ge中的锡掺入量。我们已经证明了Ge_(1-x)Sn_x纳米线在芯中的Snrnin掺入量约为1 at。%,并且富含Sn的薄壳中的Sn含量高达torn10 at。%,远远超出了Sn在块状Ge中的平衡溶解度。

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