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Carrier transport and memory mechanisms of multilevel resistive memory devices with an intermediate state based on double-stacked organic/inorganic nanocomposites

机译:基于双层有机/无机纳米复合材料的中间状态多层电阻存储器件的载流子传输和存储机制

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Multilevel resistive memory devices with an intermediate state were fabricated utilizing a poly(-methylmethacrylate) (PMMA) layer sandwiched between double-stacked PMMA layers containing CdSe/ ZnS core-shell quantum dots (QDS). The current-voltage (I-V) curves on a Al/[PMMA:CdSe/ZnS QD]/ PMMA/[PMMA:CdSe/ZnS QP]/indium-tin-oxide/glass device at low applied voltages showed current bistabilities with three states, indicative of multilevel characteristics. A reliable intermediate state was realized under positive and negative applied voltages. The carrier transport and the memory mechanisms of the devices were described on the basis of the I-V curves and energy band diagrams, respectively. The write-read-erase-read-erase-read sequence of the devices showed rewritable, nonvolatile, multilevel, and memory behaviors. The currents as functions of the retention time showed that three current states were maintained for retention times larger than 1 × 10~4 s, indicative of the good stability of the devices.
机译:利用夹在包含CdSe / ZnS核壳量子点(QDS)的双堆叠PMMA层之间的聚(甲基丙烯酸甲酯)(PMMA)层,制造了具有中间状态的多级电阻存储器件。 Al / [PMMA:CdSe / ZnS QD] / PMMA / [PMMA:CdSe / ZnS QP] /氧化铟锡/玻璃器件在低施加电压下的电流-电压(IV)曲线显示三种状态的电流双稳态,表示多级特征。在正负电压下实现了可靠的中间状态。分别基于IV曲线和能带图描述了器件的载流子传输和存储机制。设备的写-读-擦除-读-擦除-读取序列显示出可重写,非易失性,多级和内存行为。电流作为保持时间的函数表明,对于大于1×10〜4 s的保持时间,维持了三种电流状态,这表明器件具有良好的稳定性。

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