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Influence of the sample-probe coupling on the resolution of transmitted near-field optical image

机译:样品-探针耦合对透射近场光学图像分辨率的影响

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Numerical simulation of photon scanning tunneling microscopy is presented to study the near-field distribution in the vicinity a dielectric surface with one-dimensional sub-wavelength structures. Multiple scattering between the probe tip and the sample has been taken into account implicitly by matching electromagnetic boundary conditions at interfaces. The near-field intensity in transmission mode through two ridges on surface has been modeled in order to to analyze the resolution of the system. The effects on the signal by the sample-tip coupling, the polarization of the incident light, and the angle of incidence are investigated. We find that the capability to recognize the feature will be improved when the tip-object interaction is strong.
机译:提出了光子扫描隧道显微镜的数值模拟,以研究具有一维亚波长结构的介电表面附近的近场分布。通过匹配界面处的电磁边界条件,隐式考虑了探针尖端和样品之间的多次散射。为了分析系统的分辨率,已经对通过表面上两个脊的透射模式下的近场强度进行了建模。研究了样品尖端耦合,入射光的偏振和入射角对信号的影响。我们发现,当尖端与对象的交互作用很强时,识别特征的能力将得到提高。

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