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Carrier dynamics in GaAs-Al_0.46Ga_0.54As superlattice structure grown by molecular beam epitaxy

机译:分子束外延生长GaAs-Al_0.46Ga_0.54As超晶格结构中的载流子动力学

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摘要

Molecular beam epitaxy (MBE)GROWN GaAs-Al_0.46Ga_0.54As wuperlattice(SL)structure containing one thicker single quantum well(SQW)are investigted with use of time-resolved photoluminescence in the temperature range 10-300K. Analysing the temperature dependence of the integrated PL intensity, we observe ther- mally activated carrier transfer from the SL to the SQW, for temperature higher than 70 K. Both radiative and nonradiative recombination times have been extracted from the combined measurements of the PL decay time and the PL-integrated intensity.
机译:研究了分子束外延(MBE)生长的GaAs-Al_0.46Ga_0.54As含一个较厚单量子阱(SQW)的wuperlattice(SL)结构,并在10-300K的温度范围内使用了时间分辨光致发光技术。分析积分PL强度的温度依赖性,我们观察到温度高于70 K时,热激活的载流子从SL转移到SQW。从PL衰减时间的组合测量中提取了辐射和非辐射复合时间和PL整合强度。

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