Refractive index measurement of pure and Er~3+ -doped ZrO_2-SiO_2 sol-gel film by using the Brewster angle technique

摘要

The application of the Brewster angle technique and a genetic algorithm for the measurements of refractive index and thickness in tetragonal ZrO_2:Er~3+ and ZrO_2-SiO_2 films prepared by the sol-gel process and dip-coating technique annealed at 550 deg. C are reported. A precision higher than 99.5/100 and 98/100 in the refractive index and thickness mea- surements were obtained, respectively. Analysis of the capability to tune the refractive index of high-density blend films by changing the molar concentration of zirconium dioxide, with an increment rate of (0.0052±0.0004)/mol, are also presented.