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Refractive index measurements of thin films using both Brewster and m-line technique: A combined experimental setup

机译:同时使用Brewster和m-line技术测量薄膜的折射率:组合实验装置

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摘要

We report on refractive index measurements of guiding and non-guiding films synthesized by the sol-gel technique. An experimental setup has been developed in our laboratory based on both m-line and Brewster angle methods. The main feature of the setup is the ability to perform both m-line and Brewster angle measurements on the same sample allowing a more accurate measurement of the refractive index. Moreover, using laser sources at different wavelengths, we are able to measure refractive index as a function of wavelength in the visible and near infrared spectral range. We have tested our experimental setup performing measurements on many guiding and non-guiding sol-gel films deposited by the spin-coating technique on glass substrates. Estimation of refractive indices for non-absorbing thin films with an accuracy and reproducibility to within 0.1%, in a spectral region from 532 nm to 780 nm, has been achieved. (c) 2005 Elsevier B.V. All rights reserved.
机译:我们报告了通过溶胶-凝胶技术合成的引导膜和非引导膜的折射率测量结果。我们的实验室已根据m线法和布鲁斯特角法开发了一种实验装置。该设置的主要特点是能够对同一样品执行m线和布鲁斯特角测量,从而可以更精确地测量折射率。此外,使用不同波长的激光源,我们能够在可见光和近红外光谱范围内测量折射率与波长的关系。我们已经测试了我们的实验装置,该装置在通过旋涂技术沉积在玻璃基板上的许多引导和非引导溶胶-凝胶薄膜上执行测量。在532nm至780nm的光谱区域中,已经实现了对非吸收性薄膜的折射率的准确度和可重复性的估计,误差在0.1%以内。 (c)2005 Elsevier B.V.保留所有权利。

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