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首页> 外文期刊>Optical engineering >Zoom into picometer: a picoscale equivalent phase-difference-generating method for testing heterodyne interferometers without ultraprecision stages
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Zoom into picometer: a picoscale equivalent phase-difference-generating method for testing heterodyne interferometers without ultraprecision stages

机译:缩小Picometer:用于测试Haterodyne Tenferomers的Picoscale等效相位差异,没有超微级

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摘要

A simple and low-budget method aiming to generate phase difference equivalent to picoscale-measured displacements of heterodyne interferometers is proposed. By changing the length of an interference arm in an interferometer-like optical configuration, a small phase difference between the two wavelengths is generated for creating the same effect as a picoscale-measured displacement of the heterodyne interferometer. It is derived and experimentally demonstrated that the zoom factor, defined as the ratio of displacements in a heterodyne interferometer and the proposed method leading to the same phase difference, is proportional to the beat frequency and generally in a scale of 10~(-9). Thus, instead of ultraprecision piezo-stages, only a commercial linear guide rail is equipped in the method, and rigorous vibrating isolation is not necessary. The method has been already used to evaluate signal-processing electronics of a heterodyne grating interferometer.
机译:提出了一种简单且低预算的方法,其旨在产生相当于外差干涉仪的PicoScale测量位移的相位差。通过改变干涉臂的干涉臂的长度,在类似的光学配置中,产生两个波长之间的小相位差,用于产生与外差干涉仪的微差的测量位移相同的效果。它被衍生和实验证明,定义为外差干涉仪中的位移比和导致相同相位差的所提出的方法的变焦因子与拍频率成比例,通常以10〜(-9)的等级成比例。因此,代替超出超自眼压电级,在该方法中仅配备了商用线性导轨,并且不需要严格的振动隔离。该方法已经用于评估外差光栅干涉仪的信号处理电子器件。

著录项

  • 来源
    《Optical engineering》 |2019年第6期|064101.1-064101.8|共8页
  • 作者单位

    Harbin Institute of Technology Center of Ultra-precision Optoelectronic Instrument Engineering Harbin China Key Lab of Ultra-precision Intelligent Instrumentation (Harbin Institute of Technology) Ministry of Industry and Information Technology Harbin China;

    Harbin Institute of Technology Center of Ultra-precision Optoelectronic Instrument Engineering Harbin China Key Lab of Ultra-precision Intelligent Instrumentation (Harbin Institute of Technology) Ministry of Industry and Information Technology Harbin China;

    Harbin Institute of Technology Center of Ultra-precision Optoelectronic Instrument Engineering Harbin China Key Lab of Ultra-precision Intelligent Instrumentation (Harbin Institute of Technology) Ministry of Industry and Information Technology Harbin China;

    Harbin Institute of Technology Center of Ultra-precision Optoelectronic Instrument Engineering Harbin China Key Lab of Ultra-precision Intelligent Instrumentation (Harbin Institute of Technology) Ministry of Industry and Information Technology Harbin China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    heterodyne interferometry; picometer displacements; phase-difference generating;

    机译:外差干涉测量;Picometer位移;相位差产生;

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