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首页> 外文期刊>Optical and quantum electronics >Full geometric simulation of miniaturized GaN double-heterojunction high electron mobility transistors by a multiscale approach coupling quantum and semi-classical transport
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Full geometric simulation of miniaturized GaN double-heterojunction high electron mobility transistors by a multiscale approach coupling quantum and semi-classical transport

机译:结合量子和半经典输运的多尺度方法对小型化GaN双异质结高电子迁移率晶体管进行完整的几何模拟

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摘要

In this paper, a multiscale approach coupling semi-classical drift-diffusion (DD) and the quantum mechanical non-equilibrium Green's function (NEGF) formalism is established to simulate the full geometry of miniaturized GaN high electron mobility transistors (HEMTs). DD current flow is corrected locally in the HEMT channel, where electron transport represented by the NEGF is governed by quantum effects. As a result, simulated drain current-drain voltage and drain current-gate voltage curves are easily fitted to experimental data without fitting mobility. The variation of electric behavior predicted by our multiscale approach is in agreement with that expected from 2D electrostatics. This work indicates that it is practical and efficient to include NEGF in a DD solver, which is still the workhorse of the technology computer-aided design industry.
机译:本文建立了一种结合半经典漂移扩散(DD)和量子力学非平衡格林函数(NEGF)形式主义的多尺度方法,以模拟小型化GaN高电子迁移率晶体管(HEMT)的完整几何形状。 DD电流在HEMT通道中被局部校正,其中NEGF表示的电子传输受量子效应控制。结果,模拟的漏极电流-漏极电压曲线和漏极电流-栅极电压曲线很容易拟合到实验数据,而没有拟合迁移率。我们的多尺度方法预测的电行为变化与2D静电学预期的变化一致。这项工作表明将NEGF包含在DD求解器中既实用又有效,而DD求解器仍然是计算机辅助设计技术行业的主力军。

著录项

  • 来源
    《Optical and quantum electronics》 |2015年第8期|2659-2666|共8页
  • 作者单位

    State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, China,Crosslight Software Inc. China Branch, Suite 906, Building JieDi, 2790 Zhongshan Bei Road, Shanghai 200063, China;

    Crosslight Software Inc. China Branch, Suite 906, Building JieDi, 2790 Zhongshan Bei Road, Shanghai 200063, China;

    Crosslight Software Inc. China Branch, Suite 906, Building JieDi, 2790 Zhongshan Bei Road, Shanghai 200063, China;

    State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    HEMT; Quantum ballistic transport; Drift-diffusion; NEGF; Multiscale approach; Mesoscopic; Simulation; Apsys;

    机译:HEMT;量子弹道运输;漂移扩散NEGF;多尺度方法;介观的模拟;Apsys公司;

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