Exploring advantages of ~4He-PIXE analysis for layered objects in cultural heritage

摘要

In the field of cultural heritage ~4He particle beams are often used to perform RBS analysis. In most cases the simultaneously produced X-rays are not considered for PIXE analysis. This paper aims to explore the potentials of ~4He induced X-ray emission (α-PIXE) using 4, 5 and 6 MeV ~4He beams and to compare its performance with that of conventional PIXE with 3 MeV protons. The α-PIXE and α-RBS spectra were collected at the same time in a vacuum chamber. The X-ray yields produced by 6 MeV ~4He beam for K-lines were found to be superior to those of protons for atomic numbers below 25. An additional advantage of α-PIXE is the lower bremsstrahlung background which leads to an improved peak to noise ratio for certain elements.