首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Absolute detection efficiencies for keV energy atoms incident on a microchannel plate detector
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Absolute detection efficiencies for keV energy atoms incident on a microchannel plate detector

机译:入射在微通道板检测器上的keV能量原子的绝对检测效率

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摘要

The absolute detection efficiencies of a microchannel plate detector (MCP) were determined experimentally for neutral hydrogen, carbon, and tungsten atoms with impact energies of 0.5-4.5 keV. We measured detection efficiencies using our recently developed method, which uses coincidence counting between neutralized incident ions and ionized target atoms in single-electron capture collisions. The obtained detection efficiencies showed similar impact-energy and mass dependence to those of rare gas atoms (Ne, Ar, Kr, and Xe), measured previously using our method. The detection efficiencies increased with increasing impact energy and converged to the open area ratio (~50%) of the MCP used. The efficiencies at fixed energies decreased as the mass of the incident atom increased. The absolute detection efficiencies obtained for H, C, W, Ne, Ar, Kr, and Xe atoms could be scaled according to the average electron emission yield estimated using the formulas for electronic and nuclear stopping powers.
机译:实验确定了冲击能为0.5-4.5 keV的中性氢,碳和钨原子的微通道板检测器(MCP)的绝对检测效率。我们使用最近开发的方法测量了检测效率,该方法使用中和的入射离子与单电子捕获碰撞中的电离目标原子之间的重合计数。获得的检测效率显示出与以前使用我们的方法测量的稀有气体原子(Ne,Ar,Kr和Xe)相似的冲击能和质量依赖性。检测效率随着冲击能量的增加而增加,并收敛到所用MCP的开口率(〜50%)。固定能量的效率随入射原子质量的增加而降低。 H,C,W,Ne,Ar,Kr和Xe原子获得的绝对检测效率可以根据使用电子和核停止功率公式估算的平均电子发射产率来缩放。

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