Application of Si-strip technology to X-ray diffraction instrumentation

摘要

We describe the successful technology transfer of High Energy Physics (HEP) silicon-strip detectors for tracking of minimum ionising particles (MIPS) to industrial X-ray diffraction instruments. In our application the detector is used to measure 1 -D intensity profiles of low-energy photons. The challenges of such an application are low noise because of the relatively low energy of X-ray photons, from 5 to 22 keV, and high count rate capability. The technical implementation, with a focus on custom designed front-end electronics and optimisation of strip geometry taking into account the charge division effects, is shown and the achieved performance is summarized. The detector was launched several years ago and we report on the in-field experience. Lastly, we describe several scientific applications.