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Improved lifetime of microchannel-plate PMTs

机译:延长微通道板PMT的使用寿命

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摘要

The charged particle identification at the PANDA experiment will be mainly performed with DIRC detectors. Because of their advantageous properties the preferred photon sensors are MCP-PMTs. However, until recently these devices showed serious aging problems which resulted in a diminishing quantum efficiency (QE) of the photo cathode. By applying innovative countermeasures against the aging causes, the manufacturers recently succeeded in drastically improving the lifetime of MCP-PMTs. Especially the application of an ALD coating technique to seal the material of the micro-channels proves very powerful and results in a lifetime of ≈6 C/cm~2 integrated anode charge without a substantial QE degradation for the latest PHOTONIS XP85112. This paper will present a comparative measurement of the lifetime of several older and recent MCP-PMTs demonstrating this progress.
机译:PANDA实验中的带电粒子识别将主要使用DIRC探测器进行。由于其有利的特性,首选的光子传感器是MCP-PMT。然而,直到最近,这些设备仍显示出严重的老化问题,导致光阴极的量子效率(QE)下降。通过应用针对老化原因的创新对策,制造商最近成功地大幅度提高了MCP-PMT的使用寿命。尤其是,ALD涂层技术用于密封微通道材料的应用被证明是非常强大的,并且对于最新的PHOTONIS XP85112,集成阳极电荷的使用寿命约为≈6 C / cm〜2,而不会显着降低QE。本文将对几种较老的MCP-PMT的使用寿命进行比较测量,以证明这一进展。

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