首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >Development of a compact radiation-hardened low-noise front-end readout ASIC for CZT-based hard X-ray imager
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Development of a compact radiation-hardened low-noise front-end readout ASIC for CZT-based hard X-ray imager

机译:面向基于CZT的硬X射线成像仪的紧凑型辐射硬化低噪声前端读出ASIC的开发

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摘要

In this paper, we present the development and performances of a radiation-hardened front-end readout application-specific integrated circuit (ASIC) dedicated to CZT detectors for a hard X-ray imager in space applications. The readout channel consists of a charge sensitive amplifier (CSA), a CR-RC shaper, a fast shaper, a discriminator and a driving buffer. With the additional digital filtering, the readout channel can achieve very low noise performances and low power dissipation. An eight-channel prototype ASIC is designed and fabricated in 0.35 μm CMOS process. The energy range of the detected X-rays is evaluated as 1.45 keV to 281 keV. The gain is larger than 100 mV/fC. The equivalent noise charge (ENC) of the ASIC is 53 e~- at zero farad plus 10 e~- per picofarad. The power dissipation is less than 4.4 mW/channel. Through the measurement with a CZT detector, the energy resolution is less than 3.45 keV (FWHM) under the irradiation of the radioactive source ~(241)Am. The radiation effect experiments indicate that the proposed ASIC can resist the total ionization dose (TID) irradiation of higher than 200 krad (Si).
机译:在本文中,我们介绍了专用于太空应用中的硬X射线成像仪的CZT检测器的辐射硬化前端读出专用集成电路(ASIC)的开发和性能。读出通道由电荷敏感放大器(CSA),CR-RC整形器,快速整形器,鉴别器和驱动缓冲器组成。通过附加的数字滤波,读出通道可以实现非常低的噪声性能和低功耗。采用0.35μmCMOS工艺设计和制造了八通道原型ASIC。所检测到的X射线的能量范围被评估为1.45keV至281keV。增益大于100 mV / fC。 ASIC的等效噪声电荷(ENC)为零法拉时为53 e--,每微微法拉为10 e--。功耗小于4.4 mW /通道。通过CZT检测器的测量,在放射源〜(241)Am的照射下,能量分辨率小于3.45 keV(FWHM)。辐射效应实验表明,所提出的ASIC可以抵抗高于200 krad(Si)的总电离剂量(TID)辐射。

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    Institute of Microelectronics, School of Computer Science and Technology, Northwestern Polytechnical University, Xi'an, China;

    Institute of Microelectronics, School of Computer Science and Technology, Northwestern Polytechnical University, Xi'an, China;

    Institute of Microelectronics, School of Computer Science and Technology, Northwestern Polytechnical University, Xi'an, China;

    Institute of Microelectronics, School of Computer Science and Technology, Northwestern Polytechnical University, Xi'an, China;

    Institute of Microelectronics, School of Computer Science and Technology, Northwestern Polytechnical University, Xi'an, China;

    Institute of Microelectronics, School of Computer Science and Technology, Northwestern Polytechnical University, Xi'an, China;

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  • 正文语种 eng
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  • 关键词

    Low noise; Readout ASIC; Front-end electronics; CZT detector; Hard X-ray imager;

    机译:低噪声;读出ASIC;前端电子产品;CZT检测器;硬X射线成像仪;

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