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A new method for designing dual foil electron beam forming systems.Ⅰ. Introduction, concept of the method

机译:一种设计双箔电子束形成系统的新方法。介绍,方法的概念

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In Part Ⅰ of this work existing methods and problems in dual foil electron beam forming system design are presented. On this basis, a new method of designing these systems is introduced. The motivation behind this work is to eliminate the shortcomings of the existing design methods and improve overall efficiency of the dual foil design process. The existing methods are based on approximate analytical models applied in an unrealistically simplified geometry. Designing a dual foil system with these methods is a rather labor intensive task as corrections to account for the effects not included in the analytical models have to be calculated separately and accounted for in an iterative procedure. To eliminate these drawbacks, the new design method is based entirely on Monte Carlo modeling in a realistic geometry and using physics models that include all relevant processes. In our approach, an optimal configuration of the dual foil system is found by means of a systematic, automatized scan of the system performance in function of parameters of the foils. The new method, while being computationally intensive, minimizes the involvement of the designer and considerably shortens the overall design time. The results are of high quality as all the relevant physics and geometry details are naturally accounted for. To demonstrate the feasibility of practical implementation of the new method, specialized software tools were developed and applied to solve a real life design problem, as described in Part Ⅱ of this work.
机译:在这项工作的第一部分中,介绍了双箔电子束形成系统设计中的现有方法和问题。在此基础上,介绍了一种设计这些系统的新方法。这项工作的动机是消除现有设计方法的缺点,并提高双箔设计过程的整体效率。现有方法基于应用于不切实际的简化几何中的近似分析模型。用这些方法设计双箔系统是一项相当费力的工作,因为要考虑分析模型中未包括的影响的校正必须单独计算并在迭代过程中考虑。为了消除这些缺点,新的设计方法完全基于真实几何中的蒙特卡洛建模,并使用包括所有相关过程的物理模型。在我们的方法中,通过根据箔的参数对系统性能进行系统的自动扫描,找到了双箔系统的最佳配置。新方法虽然计算量大,但可以最大程度地减少设计人员的参与,并大大缩短了总体设计时间。自然地考虑了所有相关的物理和几何细节,结果是高质量的。为了证明新方法实际实施的可行性,开发了专门的软件工具并将其用于解决现实生活中的设计问题,如本文第二部分所述。

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