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首页> 外文期刊>NEC Research & Development >Micro-Bump Formation Technology for Flip-Chip LSIs Using Micro-Solder-Ball
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Micro-Bump Formation Technology for Flip-Chip LSIs Using Micro-Solder-Ball

机译:使用微焊球的倒装芯片LSI的微凸点形成技术

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摘要

Micro-bump formation technology on advanced LSIs was investigated for flip chip interconnection. Advanced LSIs have a large number of electrode pads and a density chat is continuously increasing. A novel bump formation method for these LSIs has been developed using a process that enables the fabrication of precision-sized micro-solder-balls. This process facilitates the fabrication of 100 μm balls with a diameter of 100 +- 5 μm. The novel method consists of a solder ball arraying process in an arraying plate in conductive fluid. The static electricity in the conductive fluid is canceled, and during the transforming process, solder balls are moved from the arraying plate to the electrode pads on the LSI. This bump formation experiment using 100 μm balls resulted in the production of approximately 4,000 micro-solder-ball bumps arranged in a 200 μm pitch area array as formed on LSIs.
机译:研究了先进LSI上的微凸点形成技术,用于倒装芯片互连。先进的LSI具有大量的电极垫,并且密度聊天不断增加。已经开发了用于这些LSI的新颖的凸块形成方法,该方法使用能够制造尺寸精确的微焊球的工艺。此过程有助于制造直径为100±5μm的100μm球。该新方法包括在导电流体中的排列板上的焊球排列过程。消除了导电流体中的静电,在转换过程中,焊球从排列板移动到LSI上的电极焊盘。使用100μm球的凸点形成实验导致生产了大约4,000个以LSI上的200μm节距区域阵列排列的微焊球凸点。

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