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Optical Defect Modes in Chiral Liquid Crystals at Birefringent Defect Layer

机译:双折射缺陷层在手性液晶中的光学缺陷模式

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摘要

An analytic approach to the theory of the optical defect modes in chiral liquid crystals (CLC) for the case of a birefringent defect layer is developed. The analytic study is facilitated by the choice of the problem parameters. Namely, a birefringent layer (with the averaged dielectric susceptibility equal to the average dielectric susceptibility of CLC) sandwiched between two CLC layers inserted in an isotropic medium with the dielectric constant equal to the average dielectric constant of CLC is studied. The chosen model allows one to get rid off the polarization mixing at the external surfaces of the defect structure (DMS) and to reduce the corresponding equations to the equations for light of diffracting in CLC polarization only. The dispersion equation determining connection of the defect mode frequency with the layer birefringence and other parameters of the defect structure is obtained. Analytic expressions for the transmission and reflection coefficients of the defect mode structure (CLC- birefringent defect layer-CLC) are presented and analyzed. It is shown that generally speaking the layer birefringence reduces the DM lifetime in comparison with the DMS with an isotropic defect layer and only at discrete values of DMS parameters it achieves the value of the corresponding DMS with an isotropic defect layer. Correspondingly, generally speaking, the effect of anomalously strong light absorption at the defect mode frequency and the lowering of the lasing threshold are not so pronounced as in the case of the DMS with an isotropic defect layer. The case of DMS with low defect layer birefringence is studied in details. The options of effectively influence at the DM parameters by changing the defect layer birefringence are discussed.
机译:针对双折射缺陷层的情况,开发了一种手性液晶(CLC)光学缺陷模式理论的解析方法。选择问题参数可以促进分析研究。即,研究了在介电常数等于CLC的平均介电常数的各向同性介质中插入的两个CLC层之间夹着的双折射层(平均介电常数与CLC的平均介电常数相等)。选择的模型允许摆脱缺陷结构(DMS)外表面的偏振混合,并将相应的方程式简化为仅用于CLC偏振衍射光的方程式。得到确定色散模式频率与层双折射和缺陷结构的其他参数的关系的色散方程。给出并分析了缺陷模式结构(CLC-双折射缺陷层-CLC)的透射系数和反射系数的解析表达式。结果表明,与具有各向同性缺陷层的DMS相比,层双折射通常会降低DM寿命,并且仅在离散DMS参数值下,它才能获得具有各向同性缺陷层的相应DMS的值。相应地,通常来说,与具有各向同性缺陷层的DMS相比,在缺陷模式频率处异常强的光吸收效果和降低激射阈值的效果并不那么明显。详细研究了具有低缺陷层双折射的DMS的情况。讨论了通过更改缺陷层双折射来有效影响DM参数的选项。

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  • 来源
    《Molecular Crystals and Liquid Crystals》 |2012年第1期|p.50-68|共19页
  • 作者

    V. A. Belyakov;

  • 作者单位

    Landau Institute for Theoretical Physics, Russian Academy of Sciences, 142432, Chernogolovka, Moscow, Russia;

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