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首页> 外文期刊>Microwave and Wireless Components Letters, IEEE >RF-MEMS Tuned GaN HEMT based Cavity Oscillator for X-band
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RF-MEMS Tuned GaN HEMT based Cavity Oscillator for X-band

机译:基于RF-MEMS调谐GaN HEMT的X波段腔振荡器

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This letter presents a radio frequency micro-electromechanical systems (RF-MEMS) tuned cavity oscillator for X-band. The active part of the oscillator is implemented in GaN-HEMT MMIC technology. The RF-MEMS-switches are realized on a quartz substrate that is surface mounted on a low loss PCB. The PCB is intruded in an aluminum cavity acting as an electrically moveable wall. For a three-row RF-MEMS setup, a tuning range of 5 % around an oscillation frequency of 10 GHz is demonstrated in measurements. The phase noise is as low as -140 dBc/Hz to -129 dBc/Hz at 100 kHz from the carrier, depending on the configuration of the RF-MEMS.
机译:这封信介绍了用于X波段的射频微机电系统(RF-MEMS)调谐腔振荡器。振荡器的有源部分采用GaN-HEMT MMIC技术实现。 RF-MEMS开关在石英基板上实现,该石英基板表面安装在低损耗PCB上。 PCB插入作为电活动壁的铝腔中。对于三行RF-MEMS装置,测量结果表明,在10 GHz振荡频率附近的调谐范围为5%。在距载波100 kHz处,相位噪声可低至-140 dBc / Hz至-129 dBc / Hz,具体取决于RF-MEMS的配置。

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