Phase-Noise Analysis of an X-Band Ultra-Low Phase-Noise GaN HEMT Based Cavity Oscillator

摘要

This paper reports on an ultra-low phase-noise oscillator based on a GaN HEMT monolithic microwave integrated circuit reflection amplifier and an aluminum cavity resonator. It is experimentally investigated how the oscillator’s phase noise depends on the cavity coupling factor, phase matching, and bias condition of the reflection amplifier. For the optimum bias and cavity position phase noise of dBc/Hz and dBc/Hz at offsets of 100 and 400 kHz, respectively, from a 9.9-GHz carrier frequency is reached. This is, to the best of the authors’ knowledge, a record in reported performance for any oscillator based on a GaN HEMT device. The optimum performance at 400-kHz offset corresponds to a power normalized figure of merit of 227 and compensating for finite efficiency in the reflection amplifier, the achieved result is within 7 dB from the theoretical noise floor, assuming a linear theory.