首页> 外文期刊>Microsystem Technologies >Optimization of thermal fly-height control slider geometry for Tbit/in2 recording
【24h】

Optimization of thermal fly-height control slider geometry for Tbit/in2 recording

机译:用于Tbit / in 2 记录的热飞高控制滑块几何形状的优化

获取原文
获取原文并翻译 | 示例

摘要

Magnetic storage advances including thermal fly-height control (TFC) technology were able to reduce the clearance between the read/write elements of the slider and the disk surface to increase the recording density of hard disk drives without compromising the stability of the head–disk interface (HDI). Sliders employing TFC technology are designed for flying recording and can yield clearances of few nanometers. However, it is estimated that TFC technology alone cannot provide the even smaller clearances necessary to achieve Tbit/in2 recording densities primarily due to the presence of instability-inducing vibrations at the HDI. In this work we perform optimization of the geometry of TFC technology sliders to achieve extremely high-density recording. We propose a flyability parameter coupled with a dynamic, contact mechanics-based friction model of the HDI that accounts for TFC geometry and its influence on the HDI dynamics. Optimization results are analyzed and an operating actuation range is identified that can yield Tbit/in2 recording densities with Angstrom-level clearance and minimized vibrations while also accounting for manufacturing and operational tolerances. This allows for light (lubricant) contact or ‘surfing’ recording. The proposed methodology can be used to reduce wear at the interface and investigate the feasibility of contact recoding.
机译:包括热飞行高度控制(TFC)技术在内的磁存储技术的进步,能够减小滑块的读/写元件与磁盘表面之间的间隙,从而增加了硬盘驱动器的记录密度,而不会损害磁头磁盘的稳定性。接口(HDI)。采用TFC技术的滑块设计用于飞行记录,并且可以产生几纳米的间隙。但是,据估计,主要是由于HDI上存在引起不稳定性的振动,仅TFC技术无法提供实现Tbit / in 2 记录密度所需的甚至更小的间隙。在这项工作中,我们对TFC技术滑块的几何形状进行了优化,以实现极高密度的记录。我们提出了可飞行性参数,并结合了基于动态接触力学的HDI摩擦模型,该模型考虑了TFC几何形状及其对HDI动力学的影响。分析了优化结果,确定了可产生Tbit / in 2 记录密度且具有Angstrom级间隙和最小振动的操作范围,同时还考虑了制造和操作公差。这样可以进行轻(润滑剂)接触或“冲浪”记录。所提出的方法可用于减少界面处的磨损并研究接触式编码的可行性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号