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Inversion coefficient optimization based Analog/RF circuit design automation

机译:基于反演系数优化的模拟/射频电路设计自动化

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摘要

Motivation of analog circuit automation tools has focused on improving the efficiency, where solving of a highly nonlinear design problem takes considerably long time even if the process is fully automated. One of the problems of the circuit sizing tools is inaccurate performance evaluations, where operation regions of transistors are roughly estimated with simplified models. Typically, inversion coefficient (IC) is commonly used to determine the actual operation region of a transistor, which gives detailed and accurate information about the whole saturation region (weak, moderate, and strong inversion). Co-optimization IC of transistors considering the figure of merit (FOM) for a given problem can canalize the optimizer to find circuits biased properly and enhance the efficiency of the synthesis tools. In this study, an IC optimization based analog/RF circuit sizing approach is proposed, in which ICs of transistors are defined as design parameters and optimized as well as the electrical performances. FOMs of analog and RF circuits were defined as the function of IC and the most efficient IC values were determined. Based on this knowledge, three different circuits were optimized by using the developed tool and a conventional tool. Synthesis results indicated that the proposed approach considerably accelerates the synthesis process, where the convergence time was improved by 25% similar to 30%.
机译:模拟电路自动化工具的动机集中在提高效率上,在该效率下,即使过程是完全自动化的,解决高度非线性的设计问题也要花费相当长的时间。电路尺寸确定工具的问题之一是性能评估不准确,其中使用简化模型粗略估计了晶体管的工作区域。通常,反相系数(IC)通常用于确定晶体管的实际工作区域,从而给出有关整个饱和区域(弱,中度和强反相)的详细和准确的信息。考虑到给定问题的品质因数(FOM)的晶体管共优化IC可以使优化器合理化,以找到正确偏置的电路,并提高综合工具的效率。在这项研究中,提出了一种基于IC优化的模拟/ RF电路尺寸确定方法,其中将晶体管的IC定义为设计参数并对其进行了优化,并优化了电气性能。模拟和RF电路的FOM被定义为IC的功能,并且确定了最有效的IC值。基于此知识,使用开发的工具和常规工具优化了三种不同的电路。综合结果表明,该方法大大加快了合成过程,收敛时间缩短了25%,类似于30%。

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