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机译:交流和直流测试条件下铜互连的电迁移
Novellus Systems Inc., 4000 North First Street. San Jose, CA 95134, USA;
Novellus Systems Inc., 4000 North First Street. San Jose, CA 95134, USA;
Novellus Systems Inc., 4000 North First Street. San Jose, CA 95134, USA;
National Institute of Standards and Technology, Materials Reliability Division, 325 Broadway. Boulder, CO 80305, USA;
National Institute of Standards and Technology, Materials Reliability Division, 325 Broadway. Boulder, CO 80305, USA;
electromigration; interconnect reliability;
机译:测试条件和无应力温度对铜双镶嵌亚微米互连线电迁移失效的影响-通过测试结构
机译:测试条件对Sn-Ag-Cu倒装芯片焊料互连的电迁移可靠性的影响
机译:测试条件对Sn-Ag-Cu倒装芯片焊料互连的电迁移可靠性的影响
机译:交流,脉冲直流和直流测试条件下铜互连的电迁移
机译:Al(Cu)互连中电迁移可靠性的研究。
机译:测试AC / DC假设:摇滚是噪声污染并削弱了营养级联
机译:大马士革铜互连线电迁移损伤的取向和微观结构依赖性