首页> 外文期刊>Microelectronic Engineering >Fabrication of integrated silicon PIN detector based on Al-Sn-Al bonding for ΔE-E telescope application
【24h】

Fabrication of integrated silicon PIN detector based on Al-Sn-Al bonding for ΔE-E telescope application

机译:基于Al-Sn-Al键合的ΔE-E望远镜应用的基于Al-Sn-Al粘接的集成硅销检测器的制造

获取原文
获取原文并翻译 | 示例
           

摘要

The conventional monolithic integration of silicon PIN detector as Delta E-E telescope suffer from incompatibility with IC process, signal crosstalk, high cost, etc.. In this paper, integrated silicon PIN detector based on Al-Sn-Al bonding is proposed. The intermediate conductive layer between thin and thick PIN structure comprises of metallic bonding layer, which can reduce the signal crosstalk. Moreover, the novel integration process enables known-good-die (KGD) bonding of thin and thick PIN structure, which increases flexibility and reliability of the fabrication process. Besides, the fabrication reduces the cost and increases reliability by utilizing silicon integrated process.
机译:硅引脚检测器的传统单片集成作为Delta E-E望远镜与IC工艺,信号串扰,高成本等不相容,提出了基于Al-Sn-Al键合的集成硅销检测器。 薄且厚的销结构之间的中间导电层包括金属粘合层,可以减少信号串扰。 此外,新颖的一体化过程使得薄型和厚销结构的已知良好的模具(KGD)键合,这增加了制造过程的柔韧性和可靠性。 此外,制造降低了成本并通过利用硅综合处理来提高可靠性。

著录项

  • 来源
    《Microelectronic Engineering》 |2021年第7期|111599.1-111599.5|共5页
  • 作者

    Zhu Zhiyuan; Yu Min; Jin Yufeng;

  • 作者单位

    Southwest Univ Coll Elect & Informat Engn Chongqing Key Lab Nonlinear Circuits & Intelligen Chongqing Peoples R China;

    Peking Univ Inst Microelect Natl Key Lab Sci & Technol Micro Nano Fabricat Beijing Peoples R China;

    Peking Univ Inst Microelect Natl Key Lab Sci & Technol Micro Nano Fabricat Beijing Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Silicon PIN detector; Al-Sn-Al bonding; Integration;

    机译:硅引脚探测器;al-sn-al键合;集成;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号