首页> 外国专利> Integrated amp;Dgr;E-E detector telescope

Integrated amp;Dgr;E-E detector telescope

机译:集成&D-E-E探测器望远镜

摘要

A device forming a high energy resolution integrated semiconductor &Dgr;E-E detector telescope is disclosed, in which is formed a very thin &Dgr;E detector portion (14) primarily fabricated from a first semiconductor wafer which is bonded/silicidized to a second semiconductor wafer forming an E detector portion (18). This &Dgr;E-E detector provides a well supported very thin &Dgr;E detector for high resolution. The very thin &Dgr;E detector portion bonded/silicidized to the E detector portion further provides between each other a buried metallic layer (16) acting as a contact common to the two detectors, which metal layer is thin and presents a low resistivity.
机译:公开了一种形成高能量分辨率集成半导体DEE检测器望远镜的装置,其中形成了非常薄的DE检测器部分( 14 ),该部分主要由结合/硅化到形成E检测器部分( 18 )的第二半导体晶片。此D-E-E检测器为高分辨率提供了良好支持的超薄D&E检测器。结合/硅化至E检测器部分的非常薄的D E检测器部分在彼此之间还提供了一个埋入的金属层( 16 ),用作两个检测器的公共触点,该金属层很薄并且呈现低电阻率。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号