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Simulation-Based Hardware Verification with a Graph-Based Specification

机译:基于图形的规范的基于仿真的硬件验证

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Simulation-based verification continues to be the primary technique for hardware verification due to its scalability and ease of use; however, it lacks exhaustiveness. Although formal verification techniques can exhaustively prove functional correctness, they are limited in terms of the scale of their design due to the state-explosion problem. Alternatively, semiformal approaches can involve a compromise between scalability, exhaustiveness, and resource costs. Therefore, we propose an event-driven flow graph-based specification, which can describe the cycle-accurate functional behaviors without the exploration of whole state space. To efficiently generate input sequences according to the proposed specification, we introduce a functional automatic test pattern generation (ATPG) approach, which involves the proposed intelligent redundancy-reduction strategy to solve problems of random test vectors. We also proposed functional coverage criterion based on the formal specification to support a more reliable measure of verification. We implement a verification platform based on the proposed semiformal approach and compare the proposed semiformal approach with the constrained randomized test (CRT) approach. The experiment results show that the proposed semiformal verification method ensures a more exhaustive and effective exploration of the functional correctness of designs under verification (DUVs).
机译:基于仿真的验证由于其可伸缩性和易用性而仍然是硬件验证的主要技术。但是,它缺乏穷举性。尽管形式验证技术可以详尽地证明功能的正确性,但是由于状态爆炸问题,它们在设计规模方面受到限制。另外,半正式方法可能会涉及可伸缩性,穷举性和资源成本之间的折衷。因此,我们提出了一个基于事件驱动流程图的规范,该规范可以描述周期精确的功能行为,而无需探索整个状态空间。为了根据提出的规范有效地生成输入序列,我们引入了一种功能自动测试模式生成(ATPG)方法,该方法涉及提出的智能冗余减少策略,以解决随机测试向量的问题。我们还根据正式规范提出了功能覆盖标准,以支持更可靠的验证措施。我们基于提出的半形式化方法实施验证平台,并将提出的半形式化方法与约束随机测试(CRT)方法进行比较。实验结果表明,所提出的半形式验证方法可确保对验证设计(DUV)的功能正确性进行更详尽,有效的探索。

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  • 来源
    《Mathematical Problems in Engineering》 |2018年第2期|6398616.1-6398616.10|共10页
  • 作者单位

    Natl Univ Def Technol, Coll Comp, Changsha 410072, Hunan, Peoples R China;

    Natl Univ Def Technol, Coll Comp, Changsha 410072, Hunan, Peoples R China;

    Natl Univ Def Technol, Coll Comp, Changsha 410072, Hunan, Peoples R China;

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